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Sensor Driven Reliability and Wearout Management

Sensor Driven Reliability and Wearout Management

Zhuo, Cheng; Karl, Eric; Singh, Prashant; Blaauw, David; Sylvester, Dennis

期刊名称IEEE Design & Test
作者Zhuo, Cheng; Karl, Eric; Singh, Prashant; Blaauw, David; Sylvester, Dennis
印刷ISSN2168-2356
电子ISSN2168-2364
文件大小941.34KB
发表时间2013
DOI10.1109/mdt.2009.134
页码1-1

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