Mechanical stress effect on the crystallization behavior of Ge 2 Sb 2 Te 5 films studied by electrical resistance measurement
- 期刊名称physica status solidi (RRL) - Rapid Research Letters
- 作者Du, Yingchao; Kan, Yi; Lu, Xiaomei; Liu, Yunfei; Bo, Huifeng; Cai, Wei; Hu, Dazhi; Huang, Fengzhen; Zhu, Jinsong
- 卷第7卷
- 期第7期
- 印刷ISSN1862-6254
- 文件大小486.53KB
- 发表时间2013-07
- DOI10.1002/pssr.201307167
- 页码506-509
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