SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVIII - Responsivity mapping techniques for the non-positional CCD: the swept charge device CCD236
- 作者Smith, P. H.; Murray, N. J.; MacCormick, C.; Gow, J. P. D.; Weatherill, D.; Allanwood, E.; Pool, P.; Holland, A. D.; Siegmund, Oswald H.
- 卷第8859卷
- 印刷ISSN0277-786X
- 文件大小1125.60KB
- 发表时间2013
- DOI10.1117/12.2028865
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