Electric-field and temperature dependence of the activation energy associated with gate induced drain leakage
- 期刊名称Journal of Applied Physics
- 作者Alnuaimi, Aaesha; Nayfeh, Ammar; Koldyaev, Victor
- 卷第113卷
- 期第4期
- 印刷ISSN0021-8979
- 电子ISSN1089-7550
- 文件大小1360.83KB
- 发表时间2013-01-28
- DOI10.1063/1.4789382
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