Interpreting motion and force for narrow-band intermodulation atomic force microscopy
- 期刊名称Beilstein Journal of Nanotechnology
- 作者Platz, Daniel; Forchheimer, Daniel; Tholén, Erik A; Haviland, David B
- 卷第4卷
- 电子ISSN2190-4286
- 文件大小2916.67KB
- 发表时间2013-01-21
- DOI10.3762/bjnano.4.5
- 页码45-56
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