Numerical Analysis of Breakdown Voltage Enhancement in AlGaN/GaN HEMTs With a High-$k$ Passivation Layer
Hanawa, Hideyuki; Onodera, Hiraku; Nakajima, Atsushi; Horio, Kazushige
- 期刊名称IEEE Transactions on Electron Devices
- 作者Hanawa, Hideyuki; Onodera, Hiraku; Nakajima, Atsushi; Horio, Kazushige
- 卷第61卷
- 期第3期
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小3130.95KB
- 发表时间2014-03
- DOI10.1109/TED.2014.2298194
- 页码769-775