Influences of rapid thermal process on solution-deposited Ti-silicate/Si films: Phase segregation, composition and interface changes, and dielectric properties
Lee, Seung Muk; Hwang, Soo Min; Hwang, Soon Yong; Kim, Tae Woong; Lee, Sang Hyub; Park, Geun Chul; Choi, Ju Yun; Yoon, Jae Jin; Kim, Tae Jung; Kim, Young Dong; Kim, Hyoungsub; Lim, Jun Hyung; Joo, Jinho
- 期刊名称Materials Chemistry and Physics
- 作者Lee, Seung Muk; Hwang, Soo Min; Hwang, Soon Yong; Kim, Tae Woong; Lee, Sang Hyub; Park, Geun Chul; Choi, Ju Yun; Yoon, Jae Jin; Kim, Tae Jung; Kim, Young Dong; Kim, Hyoungsub; Lim, Jun Hyung; Joo, Jinho
- 卷第145卷
- 印刷ISSN0254-0584
- 文件大小1479.57KB
- 发表时间2014-05
- DOI10.1016/j.matchemphys.2014.01.055
- 页码168-175