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Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test

Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test

de Carvalho, M.; Bernardi, P.; Sanchez, E.; Reorda, M. Sonza; Ballan, O.
  • 期刊名称Journal of Electronic Testing
  • 作者de Carvalho, M.; Bernardi, P.; Sanchez, E.; Reorda, M. Sonza; Ballan, O.
  • 卷第30卷
  • 期第3期
  • 印刷ISSN0923-8174
  • 电子ISSN1573-0727
  • 文件大小788.60KB
  • 发表时间2014-06
  • DOI10.1007/s10836-014-5457-5
  • 页码317-328
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