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A 12-b 4-MS/s SAR ADC With Configurable Redundancy in 28-nm CMOS Technology

A 12-b 4-MS/s SAR ADC With Configurable Redundancy in 28-nm CMOS Technology

Haenzsche, Stefan; Hoppner, Sebastian; Ellguth, Georg; Schuffny, Rene

期刊名称IEEE Transactions on Circuits and Systems II: Express Briefs
作者Haenzsche, Stefan; Hoppner, Sebastian; Ellguth, Georg; Schuffny, Rene
卷第61卷
期第11期
印刷ISSN1549-7747
电子ISSN1558-3791
文件大小2096.72KB
发表时间2014-11
DOI10.1109/TCSII.2014.2345301
页码835-839

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