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Multivariate Analysis Combined with Surface Mass Spectrometry (ToF-SIMS): Enabling Problem Solving and Expanding Application Space in an Industrial Environment

Multivariate Analysis Combined with Surface Mass Spectrometry (ToF-SIMS): Enabling Problem Solving and Expanding Application Space in an Industrial Environment

Lloyd, Kathryn G.
  • 期刊名称The Journal of Physical Chemistry C
  • 作者Lloyd, Kathryn G.
  • 卷第118卷
  • 期第50期
  • 印刷ISSN1932-7447
  • 电子ISSN1932-7455
  • 文件大小5530.72KB
  • 发表时间2014-12-18
  • DOI10.1021/jp505243p
  • 页码29180-29186
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