[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hourglass concept for RRAM: A dynamic and statistical device model
Degraeve, R.; Fantini, A.; Raghavan, N.; Goux, L.; Clima, S.; Chen, Y. Y.; Belmonte, A.; Cosemans, S.; Govoreanu, B.; Wouters, D. J.; Roussel, Ph.; Kar, G. S.; Groeseneken, G.; Jurczak, M.
- 作者Degraeve, R.; Fantini, A.; Raghavan, N.; Goux, L.; Clima, S.; Chen, Y. Y.; Belmonte, A.; Cosemans, S.; Govoreanu, B.; Wouters, D. J.; Roussel, Ph.; Kar, G. S.; Groeseneken, G.; Jurczak, M.
- 文件大小1160.00KB
- 发表时间2014
- DOI10.1109/IPFA.2014.6898205
- 页码245-249