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[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - ATR-FTIR, DUAL BEAM FIB-SEM, TEM and TOF-SIMS studies on high temperature and moisture induced “white haze” following the pattern of electrodes in touch panels

[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - ATR-FTIR, DUAL BEAM FIB-SEM, TEM and TOF-SIMS studies on high temperature and moisture induced “white haze” following the pattern of electrodes in touch panels

Yixin, Chen; Meng, Hao; Jingjing, Shao; Esther, Lee; Sheng, Khoo Bing; Meailing, Chooi; Kai, Li; Qiuju, Xin; Cambridge, Kon; Sheng, Lee Hwang; Yiqiang, Shen; Lu, Song; Zhenxiang, Xing; Yongkai, Zhou; Yang, Feng; Chao, Fu; Younan, Hua; Xiaomin, Li
  • 作者Yixin, Chen; Meng, Hao; Jingjing, Shao; Esther, Lee; Sheng, Khoo Bing; Meailing, Chooi; Kai, Li; Qiuju, Xin; Cambridge, Kon; Sheng, Lee Hwang; Yiqiang, Shen; Lu, Song; Zhenxiang, Xing; Yongkai, Zhou; Yang, Feng; Chao, Fu; Younan, Hua; Xiaomin, Li
  • 文件大小1900.39KB
  • 发表时间2014
  • DOI10.1109/ipfa.2014.6898153
  • 页码131-134
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