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[IEEE 2014 IEEE 29th International Conference on Microelectronics (MIEL) - Belgrade, Serbia (2014.5.12-2014.5.14)] 2014 29th International Conference on Microelectronics Proceedings - MIEL 2014 - GaN technology for power RF applications: Present reliability roadblocks and future trends

[IEEE 2014 IEEE 29th International Conference on Microelectronics (MIEL) - Belgrade, Serbia (2014.5.12-2014.5.14)] 2014 29th International Conference on Microelectronics Proceedings - MIEL 2014 - GaN technology for power RF applications: Present reliability roadblocks and future trends

Igic, P.; Faramehr, S.; Kalna, K.

作者Igic, P.; Faramehr, S.; Kalna, K.
文件大小684.83KB
发表时间2014
DOI10.1109/miel.2014.6842089
页码77-80

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