[IEEE 2014 15th Latin American Test Workshop - LATW - Fortaleza, Brazil (2014.3.12-2014.3.15)] 2014 15th Latin American Test Workshop - LATW - Specification test minimization for given defect level
Sindia, Suraj; Agrawal, Vishwani D.
- 作者Sindia, Suraj; Agrawal, Vishwani D.
- 文件大小172.69KB
- 发表时间2014
- DOI10.1109/latw.2014.6841927
- 页码1-6