[IEEE 2014 24th International Crimean Conference "Microwave & Telecommunication Technology" (CriMiCo) - Sevastopol, Ukraine (2014.9.7-2014.9.13)] 2014 24th International Crimean Conference Microwave & Telecommunication Technology - Simulation of the influence of impact ionization process on the current noise in deep submicron silicon diode
Borzdov, A. V.; Borzdov, V. M.; Busliuk, V. V.
- 作者Borzdov, A. V.; Borzdov, V. M.; Busliuk, V. V.
- 文件大小239.85KB
- 发表时间2014
- DOI10.1109/CRMICO.2014.6959640
- 页码805-806