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Electrical characterization of a buried GaSb p-n junction controlled by native defects

Electrical characterization of a buried GaSb p-n junction controlled by native defects

Gorni, M.; Parisini, A.; Gombia, E.; Baldini, M.; Vantaggio, S.; Ghezzi, C.

期刊名称Crystal Research and Technology
作者Gorni, M.; Parisini, A.; Gombia, E.; Baldini, M.; Vantaggio, S.; Ghezzi, C.
卷第49卷
期第8期
印刷ISSN0232-1300
文件大小432.45KB
发表时间2014-08
DOI10.1002/crat.201300411
页码628-633

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