发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

Probability-enhanced sufficient dimension reduction for binary classification

Probability-enhanced sufficient dimension reduction for binary classification

Shin, Seung Jun; Wu, Yichao; Zhang, Hao Helen; Liu, Yufeng
  • 期刊名称Biometrics
  • 作者Shin, Seung Jun; Wu, Yichao; Zhang, Hao Helen; Liu, Yufeng
  • 卷第70卷
  • 期第3期
  • 印刷ISSN0006-341X
  • 文件大小398.70KB
  • 发表时间2014-09
  • DOI10.1111/biom.12174
  • 页码546-555
← 返回【学霸图书馆】主页