An effective approach for the minimization of errors in capacitance-voltage carrier profiling of quantum structures
Biswas, Dipankar; Panda, Siddhartha
- 期刊名称Journal of Applied Physics
- 作者Biswas, Dipankar; Panda, Siddhartha
- 卷第115卷
- 期第13期
- 印刷ISSN0021-8979
- 电子ISSN1089-7550
- 文件大小798.62KB
- 发表时间2014-04-07
- DOI10.1063/1.4870287