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An effective approach for the minimization of errors in capacitance-voltage carrier profiling of quantum structures

An effective approach for the minimization of errors in capacitance-voltage carrier profiling of quantum structures

Biswas, Dipankar; Panda, Siddhartha
  • 期刊名称Journal of Applied Physics
  • 作者Biswas, Dipankar; Panda, Siddhartha
  • 卷第115卷
  • 期第13期
  • 印刷ISSN0021-8979
  • 电子ISSN1089-7550
  • 文件大小798.62KB
  • 发表时间2014-04-07
  • DOI10.1063/1.4870287
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