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Displacement damage effects on CMOS APS image sensors induced by neutron irradiation from a nuclear reactor

Wang, Zujun; Huang, Shaoyan; Liu, Minbo; Xiao, Zhigang; He, Baoping; Yao, Zhibin; Sheng, Jiangkun

期刊名称AIP Advances
作者Wang, Zujun; Huang, Shaoyan; Liu, Minbo; Xiao, Zhigang; He, Baoping; Yao, Zhibin; Sheng, Jiangkun
卷第4卷
期第7期
电子ISSN2158-3226
文件大小1461.48KB
发表时间2014-07
DOI10.1063/1.4889878