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[IEEE 2014 IEEE 23rd North Atlantic Test Workshop (NATW) - Johnson City, NY, USA (2014.5.14-2014.5.16)] 2014 IEEE 23rd North Atlantic Test Workshop - CSST: An Efficient Secure Split-Test for Preventing IC Piracy

[IEEE 2014 IEEE 23rd North Atlantic Test Workshop (NATW) - Johnson City, NY, USA (2014.5.14-2014.5.16)] 2014 IEEE 23rd North Atlantic Test Workshop - CSST: An Efficient Secure Split-Test for Preventing IC Piracy

Rahman, Md. Tauhidur; Forte, Domenic; Shi, Quihang; Contreras, Gustavo K.; Tehranipoor, Mohammad
  • 作者Rahman, Md. Tauhidur; Forte, Domenic; Shi, Quihang; Contreras, Gustavo K.; Tehranipoor, Mohammad
  • 文件大小324.96KB
  • 发表时间2014
  • DOI10.1109/natw.2014.17
  • 页码43-47
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