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[IEEE 2014 IEEE Custom Integrated Circuits Conference - CICC 2014 - San Jose, CA, USA (2014.9.15-2014.9.17)] Proceedings of the IEEE 2014 Custom Integrated Circuits Conference - Anti-ESL/ESR variation robust constant-on-time control for DC-DC buck converter in 28nm CMOS technology

[IEEE 2014 IEEE Custom Integrated Circuits Conference - CICC 2014 - San Jose, CA, USA (2014.9.15-2014.9.17)] Proceedings of the IEEE 2014 Custom Integrated Circuits Conference - Anti-ESL/ESR variation robust constant-on-time control for DC-DC buck converter in 28nm CMOS technology

Chen, Hsin-Chieh; Chen, Wei-Chung; Chou, Ying-Wei; Chien, Meng-Wei; Wey, Chin-Long; Chen, Ke-Horng; Lin, Ying-Hsi; Tsai, Tsung-Yen; Lee, Chao-Cheng
  • 作者Chen, Hsin-Chieh; Chen, Wei-Chung; Chou, Ying-Wei; Chien, Meng-Wei; Wey, Chin-Long; Chen, Ke-Horng; Lin, Ying-Hsi; Tsai, Tsung-Yen; Lee, Chao-Cheng
  • 文件大小660.38KB
  • 发表时间2014
  • DOI10.1109/cicc.2014.6946134
  • 页码1-4
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