Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects
Ma, En-Hua; Wei, Wen-En; Li, Hung-Yi; Li, James Chien-Mo; Cheng, I-Chun; Yeh, Yung-Hui
- 期刊名称Journal of Display Technology
- 作者Ma, En-Hua; Wei, Wen-En; Li, Hung-Yi; Li, James Chien-Mo; Cheng, I-Chun; Yeh, Yung-Hui
- 卷第10卷
- 期第1期
- 印刷ISSN1551-319X
- 电子ISSN1558-9323
- 文件大小1530.19KB
- 发表时间2014-01
- DOI10.1109/jdt.2013.2277590
- 页码19-27