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[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Auto-identification of positive feedback loops in multi-state vulnerable circuits

[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Auto-identification of positive feedback loops in multi-state vulnerable circuits

Liu, Zhiqiang; Li, You; Geiger, Randall L.; Chen, Degang

作者Liu, Zhiqiang; Li, You; Geiger, Randall L.; Chen, Degang
文件大小283.99KB
发表时间2014
DOI10.1109/vts.2014.6818794
页码1-5

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