FAULT DETECTION FOR THE CLASS IMBALANCE PROBLEM IN SEMICONDUCTOR MANUFACTURING PROCESSES
- 期刊名称Journal of Circuits, Systems and Computers
- 作者WANG, JIAN; FENG, JIAN; HAN, ZHIYAN
- 卷第23卷
- 期第4期
- 印刷ISSN0218-1266
- 电子ISSN1793-6454
- 文件大小334.74KB
- 发表时间2014-04
- DOI10.1142/S0218126614500492
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