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[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - GPGPUs ECC efficiency and efficacy

[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - GPGPUs ECC efficiency and efficacy

Oliveira, Daniel A. G.; Rech, Paolo; Pilla, Laercio L.; Navaux, Philippe O. A.; Carro, Luigi
  • 作者Oliveira, Daniel A. G.; Rech, Paolo; Pilla, Laercio L.; Navaux, Philippe O. A.; Carro, Luigi
  • 文件大小275.66KB
  • 发表时间2014
  • DOI10.1109/dft.2014.6962085
  • 页码209-215
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