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SPIE Proceedings [SPIE SPIE Sensing Technology + Applications - Baltimore, Maryland, USA (Monday 5 May 2014)] Terahertz Physics, Devices, and Systems VIII: Advanced Applications in Industry and Defense - THz imaging Si MOSFET system design at 215 GHz

SPIE Proceedings [SPIE SPIE Sensing Technology + Applications - Baltimore, Maryland, USA (Monday 5 May 2014)] Terahertz Physics, Devices, and Systems VIII: Advanced Applications in Industry and Defense - THz imaging Si MOSFET system design at 215 GHz

Anwar, Mehdi F.; Crowe, Thomas W.; Manzur, Tariq; Sacco, Andrew P.; Newman, J. Daniel; Lee, Paul P. K.; Fourspring, Kenneth D.; Osborn, John H.; Fiete, Robert D.; Bocko, Mark F.; Ignjatovic, Zeljko; Pipher, Judith L.; McMurtry, Craig W.; Zhang, Xi-Cheng; Dayalu, Jagannath; Fertig, Gregory J.; Zhang, Chao; Ninkov, Zoran
  • 作者Anwar, Mehdi F.; Crowe, Thomas W.; Manzur, Tariq; Sacco, Andrew P.; Newman, J. Daniel; Lee, Paul P. K.; Fourspring, Kenneth D.; Osborn, John H.; Fiete, Robert D.; Bocko, Mark F.; Ignjatovic, Zeljko; Pipher, Judith L.; McMurtry, Craig W.; Zhang, Xi-Cheng; Dayalu, Jagannath; Fertig, Gregory J.; Zhang, Chao; Ninkov, Zoran
  • 卷第9102卷
  • 印刷ISSN0277-786X
  • 文件大小629.75KB
  • 发表时间2014
  • DOI10.1117/12.2050906
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