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Towards a better understanding of the electrical contact formation process of the metal contact for DC MEMS/NEMS switches with statistical means

Towards a better understanding of the electrical contact formation process of the metal contact for DC MEMS/NEMS switches with statistical means

Qiu, Haodong; Wang, Hong; Ke, Feixiang
  • 期刊名称Japanese Journal of Applied Physics
  • 作者Qiu, Haodong; Wang, Hong; Ke, Feixiang
  • 卷第53卷
  • 期第8期
  • 印刷ISSN0021-4922
  • 电子ISSN1347-4065
  • 文件大小506.86KB
  • 发表时间2014-08-01
  • DOI10.7567/JJAP.53.087201
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