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Interface Migration with Segregation in MoSi<sub>2</sub>-Based Lamellar Alloy Simulated by Phase-Field Method

Interface Migration with Segregation in MoSi₂-Based Lamellar Alloy Simulated by Phase-Field Method

Yamazaki, Toshihiro; Koizumi, Yuichiro; Chiba, Akihiko; Hagihara, Koji; Nakano, Takayoshi; Yuge, Koretaka; Kishida, Kyosuke; Inui, Haruyuki

期刊名称Advanced Materials Research
作者Yamazaki, Toshihiro; Koizumi, Yuichiro; Chiba, Akihiko; Hagihara, Koji; Nakano, Takayoshi; Yuge, Koretaka; Kishida, Kyosuke; Inui, Haruyuki
卷第922卷
电子ISSN1662-8985
文件大小1408.97KB
发表时间2014-5
DOI10.4028/www.scientific.net/AMR.922.832
页码832-837

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