SPIE Proceedings [SPIE Third Conference on Sensors, MEMS and Electro-Optic Systems - Skukuza, Kruger National Park, South Africa (Sunday 16 March 2014)] Sensors, MEMS and Electro-Optical Systems - Fine-correlation: inter-sample template matching

• 作者du Plessis, Monuko; Reyneke, Pieter V.; van der Berg, Etienne S.; de Ridder, Corné
• 卷第9257卷
• 印刷ISSN0277-786X
• 文件大小1141.07KB
• 发表时间2014
• DOI10.1117/12.2066405