发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2014 19th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW) - Porto Alegre, Brazil (2014.9.17-2014.9.19)] 19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings - The influence of No Fault Found in analogue CMOS circuits

[IEEE 2014 19th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW) - Porto Alegre, Brazil (2014.9.17-2014.9.19)] 19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop Proceedings - The influence of No Fault Found in analogue CMOS circuits

Wan, Jinbo; Kerkhoff, Hans G.

作者Wan, Jinbo; Kerkhoff, Hans G.
文件大小435.42KB
发表时间2014
DOI10.1109/IMS3TW.2014.6997388
页码1-6

← 返回【学霸图书馆】主页