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[IEEE 2014 Conference on Design of Circuits and Integrated Systems (DCIS) - Madrid, Spain (2014.11.26-2014.11.28)] Design of Circuits and Integrated Systems - ADC built-in-self-test based on a pseudorandom uniform noise generator

[IEEE 2014 Conference on Design of Circuits and Integrated Systems (DCIS) - Madrid, Spain (2014.11.26-2014.11.28)] Design of Circuits and Integrated Systems - ADC built-in-self-test based on a pseudorandom uniform noise generator

Evans, Guiomar

作者Evans, Guiomar
文件大小260.14KB
发表时间2014
DOI10.1109/dcis.2014.7035596
页码1-5

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