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Permanent magnet electron beam ion source/trap systems with bakeable magnets for improved operation conditionsa)

Permanent magnet electron beam ion source/trap systems with bakeable magnets for improved operation conditionsa)

Schmidt, M.; Zschornack, G.; Kentsch, U.; Ritter, E.
  • 期刊名称Review of Scientific Instruments
  • 作者Schmidt, M.; Zschornack, G.; Kentsch, U.; Ritter, E.
  • 卷第85卷
  • 期第2期
  • 印刷ISSN0034-6748
  • 电子ISSN1089-7623
  • 文件大小634.68KB
  • 发表时间2014-02
  • DOI10.1063/1.4828723
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