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Fast Monte Carlo-Based Estimation of Analog Parametric Test Metrics

Fast Monte Carlo-Based Estimation of Analog Parametric Test Metrics

Stratigopoulos, Haralampos-G.; Sunter, Stephen

期刊名称IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
作者Stratigopoulos, Haralampos-G.; Sunter, Stephen
卷第33卷
期第12期
印刷ISSN0278-0070
电子ISSN1937-4151
文件大小2149.02KB
发表时间2014-12
DOI10.1109/tcad.2014.2360458
页码1977-1990

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