[IEEE 2014 IEEE International Symposium on Electromagnetic Compatibility - EMC 2014 - Raleigh, NC, USA (2014.8.4-2014.8.8)] 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC) - VR noise analysis and reduction in printed circuit board designs

• 作者Ren, Yinglei; Shen, Wei; Xiao, Kai
• 文件大小1378.36KB
• 发表时间2014
• DOI10.1109/isemc.2014.6899000
• 页码375-380