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[IEEE NAECON 2014 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2014.6.24-2014.6.27)] NAECON 2014 - IEEE National Aerospace and Electronics Conference - Integrated circuit (IC) aging effects on radio-frequency distinct native attributes (RF-DNA)

[IEEE NAECON 2014 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2014.6.24-2014.6.27)] NAECON 2014 - IEEE National Aerospace and Electronics Conference - Integrated circuit (IC) aging effects on radio-frequency distinct native attributes (RF-DNA)

Deppensmith, Randall D.; Stone, Samuel J.

作者Deppensmith, Randall D.; Stone, Samuel J.
文件大小932.92KB
发表时间2014
DOI10.1109/NAECON.2014.7045830
页码331-333

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