SPIE Proceedings [SPIE SPIE Scanning Microscopies - Monterey, California, United States (Tuesday 16 September 2014)] Scanning Microscopies 2014 - Wavelet transform-based method of compensating dispersion for high resolution imaging in SDOCT
- 作者Postek, Michael T.; Newbury, Dale E.; Platek, S. Frank; Maugel, Tim K.; Bian, Haiyi; Gao, Wanrong
- 卷第9236卷
- 印刷ISSN0277-786X
- 文件大小341.67KB
- 发表时间2014
- DOI10.1117/12.2065309
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