[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Unifying scan compression
Bahl, Swapnil; Rungta, Shreyans; Khullar, Shray; Kapur, Rohit; Chandra, Anshuman; Talluto, Salvatore; Notiyath, Pramod; Rajagopalan, Ajay
- 作者Bahl, Swapnil; Rungta, Shreyans; Khullar, Shray; Kapur, Rohit; Chandra, Anshuman; Talluto, Salvatore; Notiyath, Pramod; Rajagopalan, Ajay
- 文件大小295.52KB
- 发表时间2014
- DOI10.1109/dft.2014.6962079
- 页码191-196