SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Interferometry XVII: Advanced Applications - Simple setup for optical characterization of microlenses
- 作者Furlong, Cosme; Gorecki, Christophe; de Groot, Peter J.; Novak, Erik L.; Perrin, Stephane; Baranski, Maciej; Passilly, Nicolas; Froehly, Luc; Albero, Jorge; Bargiel, Sylwester; Gorecki, Christophe
- 卷第9204卷
- 印刷ISSN0277-786X
- 文件大小885.29KB
- 发表时间2014
- DOI10.1117/12.2061299
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