Detecting Difficult Minor Elements in Particle Samples by SEM-EDS
- 期刊名称Microscopy and Microanalysis
- 作者Lindstrom, Abigail P.; Ritchie, Nicholas WM
- 卷第20卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小911.17KB
- 发表时间2014-08
- DOI10.1017/s1431927614005467
- 页码748-749
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