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Evolution of Microstructure Across Eutectic Sn-Bi Solder Joints Under Simultaneous Thermal Cycling and Current Stressing

Evolution of Microstructure Across Eutectic Sn-Bi Solder Joints Under Simultaneous Thermal Cycling and Current Stressing

Zuo, Yong; Ma, Limin; Liu, Sihan; Shu, Yutian; Guo, Fu
  • 期刊名称Journal of Electronic Materials
  • 作者Zuo, Yong; Ma, Limin; Liu, Sihan; Shu, Yutian; Guo, Fu
  • 卷第44卷
  • 期第1期
  • 印刷ISSN0361-5235
  • 电子ISSN1543-186X
  • 文件大小930.44KB
  • 发表时间2015-1
  • DOI10.1007/s11664-013-2972-6
  • 页码597-603
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