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Quickest Line Outage Detection and Identification

Quickest Line Outage Detection and Identification

Chen, Yu Christine; Banerjee, Taposh; Dominguez-Garcia, Alejandro D.; Veeravalli, Venugopal V.
  • 期刊名称IEEE Transactions on Power Systems
  • 作者Chen, Yu Christine; Banerjee, Taposh; Dominguez-Garcia, Alejandro D.; Veeravalli, Venugopal V.
  • 印刷ISSN0885-8950
  • 电子ISSN1558-0679
  • 文件大小1860.14KB
  • 发表时间2015
  • DOI10.1109/tpwrs.2015.2394246
  • 页码1-10
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