[IEEE 2015 28th IEEE International Conference on Micro Electro Mechanical Systems (MEMS) - Estoril, Portugal (2015.1.18-2015.1.22)] 2015 28th IEEE International Conference on Micro Electro Mechanical Systems (MEMS) - Hard mask free DRIE of crystalline Si nanobarrel with 6.7nm wall thickness and 50∶1 aspect ratio
Liu, Peng; Yang, Fang; Wang, Wei; Wang, Wei; Luo, Kui; Wang, Ying; Zhang, Dacheng
- 作者Liu, Peng; Yang, Fang; Wang, Wei; Wang, Wei; Luo, Kui; Wang, Ying; Zhang, Dacheng
- 文件大小3334.46KB
- 发表时间2015
- DOI10.1109/MEMSYS.2015.7050890
- 页码77-80