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Reliability and Validity of a Short Version of the General Functioning Subscale of the McMaster Family Assessment Device

Reliability and Validity of a Short Version of the General Functioning Subscale of the McMaster Family Assessment Device

Boterhoven de Haan, Katrina L.; Hafekost, Jennifer; Lawrence, David; Sawyer, Michael G.; Zubrick, Stephen R.
  • 期刊名称Family Process
  • 作者Boterhoven de Haan, Katrina L.; Hafekost, Jennifer; Lawrence, David; Sawyer, Michael G.; Zubrick, Stephen R.
  • 卷第54卷
  • 期第1期
  • 印刷ISSN0014-7370
  • 文件大小85.20KB
  • 发表时间2015-03
  • DOI10.1111/famp.12113
  • 页码116-123
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