Pattern classification using a new border identification paradigm: The nearest border technique
Li, Yifeng; Oommen, B. John; Ngom, Alioune; Rueda, Luis
- 期刊名称Neurocomputing
- 作者Li, Yifeng; Oommen, B. John; Ngom, Alioune; Rueda, Luis
- 卷第157卷
- 印刷ISSN0925-2312
- 文件大小749.43KB
- 发表时间2015-06
- DOI10.1016/j.neucom.2015.01.030
- 页码105-117