SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 7 February 2015)] Slow Light, Fast Light, and Opto-Atomic Precision Metrology VIII - Measuring the propagation of entanglement and information in dispersive media
Shahriar, Selim M.; Scheuer, Jacob; Clark, Jeremy B.; Glasser, Ryan T.; Glorieux, Quentin; Vogl, Ulrich; Li, Tian; Jones, Kevin M.; Lett, Paul D.
- 作者Shahriar, Selim M.; Scheuer, Jacob; Clark, Jeremy B.; Glasser, Ryan T.; Glorieux, Quentin; Vogl, Ulrich; Li, Tian; Jones, Kevin M.; Lett, Paul D.
- 卷第9378卷
- 印刷ISSN0277-786X
- 文件大小4695.58KB
- 发表时间2015
- DOI10.1117/12.2086776