Impacts of Random Telegraph Noise (RTN) on Digital Circuits
Luo, Mulong; Wang, Runsheng; Guo, Shaofeng; Wang, Jing; Zou, Jibin; Huang, Ru
- 期刊名称IEEE Transactions on Electron Devices
- 作者Luo, Mulong; Wang, Runsheng; Guo, Shaofeng; Wang, Jing; Zou, Jibin; Huang, Ru
- 卷第62卷
- 期第6期
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小2358.95KB
- 发表时间2015-6
- DOI10.1109/TED.2014.2368191
- 页码1725-1732