Influence of mechanical noise inside a scanning electron microscope
- 期刊名称Review of Scientific Instruments
- 作者de Faria, Marcelo Gaudenzi; Haddab, Yassine; Le Gorrec, Yann; Lutz, Philippe
- 卷第86卷
- 期第4期
- 印刷ISSN0034-6748
- 电子ISSN1089-7623
- 文件大小8328.49KB
- 发表时间2015-04
- DOI10.1063/1.4917557
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