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Atomic force microscope caliper for critical dimension measurements of micro and nanostructures through sidewall scanning

Atomic force microscope caliper for critical dimension measurements of micro and nanostructures through sidewall scanning

Xie, Hui; Hussain, Danish; Yang, Feng; Sun, Lining
  • 期刊名称Ultramicroscopy
  • 作者Xie, Hui; Hussain, Danish; Yang, Feng; Sun, Lining
  • 卷第158卷
  • 印刷ISSN0304-3991
  • 文件大小3637.23KB
  • 发表时间2015-11
  • DOI10.1016/j.ultramic.2015.06.007
  • 页码8-16
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