Supply Voltage Dependency on the Single Event Upset Susceptibility of Temporal Dual-Feedback Flip-Flops in a 90 nm Bulk CMOS Process

• 期刊名称IEEE Transactions on Nuclear Science
• 作者Hasanbegovic, Amir; Aunet, Snorre
• 卷第62卷
• 期第4期
• 印刷ISSN0018-9499
• 电子ISSN1558-1578
• 文件大小1752.27KB
• 发表时间2015-8
• DOI10.1109/tns.2015.2454479
• 页码1888-1897