A modified capacitance model of RF MEMS shunt switch incorporating fringing field effects of perforated beam
- 期刊名称Solid-State Electronics
- 作者Guha, Koushik; Kumar, Mithlesh; Agarwal, Saurabh; Baishya, Srimanta
- 卷第114卷
- 印刷ISSN0038-1101
- 文件大小1753.29KB
- 发表时间2015-12
- DOI10.1016/j.sse.2015.07.008
- 页码35-42
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